SCANNING ELECTRON MICROSCOPY (SEM)

CEMAS has four scanning electron microscopes (SEM), providing many options for students, researchers, and industrial partners to analyze and investigate their materials-related issues.

Every SEM is outfitted with EDAX silicon-drift x-ray detectors, capable of very high-count rates for rapid compositional analysis of specimens, enabling elemental mapping of specimens in minutes, rather than hours.

In addition to our Quanta 200 filament SEM, CEMAS has two Apreo high resolution SEMs capable of imaging difficult samples at high resolution with low accelerating voltages. Each Apreo is equipped with an EDAX high-speed Hikari electron backscatter diffraction (EBSD) camera that provides rapid crystallographic analysis of both bulk specimens and thin foils (Transmission Kikuchi Diffraction).

The newest SEM addition is the variable pressure Quattro ESEM equipped with multiple stages for in-situ experiments to study samples from -190 °C to 1100 °C and under load or wet conditions. Additionally, the Quattro has a full suite of analytical tools to analyze multiple aspects of each experiment.

Other capabilities available on the microscopes include large area mapping, cathodoluminescence imaging and spectroscopy, electrical feedthroughs for custom signal detection, and Scanning Transmission Electron Microscopy (STEM) imaging. Most importantly, the staff members at CEMAS have the expertise necessary to help users obtain best quality data possible, and the knowledge base to assist in its analysis.

SEM INSTRUMENT MANAGERS

portrait of Stephen BoonaDr. Stephen Boona portrait of Daniel VeghteDr. Daniel Veghte

SEM TECHNIQUES AT CEMAS

  • Energy Dispersive X-ray Spectroscopy (EDS)
  • Electron Backscatter Diffraction (EBSD)
  • Transmission Kikuchi Diffraction (TKD)
  • Cathodoluminescence (CL) Imaging and Spectroscopy
  • High resolution secondary and backscatter electron imaging
  • Large area imaging and tiling
  • In-situ tensile testing
  • Heating and cooling capabilities
  • Variable pressure operation (Low vacuum/ESEM)

SEM IN THE NEWS

  • Dust, moisture, some fiber types contribute to fungal growth, study finds

    State-of-the-art instrumentation and staff expertise at the Center for Electron Microscopy and Analysis (CEMAS) facilitated results achieved by Ohio State researchers exploring mold growth in carpets. “The equipment and training at CEMAS allowed... | LEARN MORE
  • Current model for storing nuclear waste is incomplete

    Paving the way for advanced materials research, Ohio State’s Center for Electron Microscopy (CEMAS) contributed to a study analyzing the current model for storing nuclear waste.  “The resources available at CEMAS were definitely very helpful,”... | LEARN MORE
  • Behind the lens: Stephen Boona

    Every person filters life through a different lens. And Stephen Boona , a research associate at Ohio State’s Center for Electron Microscopy and Analysis (CEMAS), is no different. Boona brings more than a decade of solid-state physics and materials science experience to his role at CEMAS. | LEARN MORE
  • CEMAS user wins International Metallographic Contest

    Cutting-edge research, or an alluring piece of art? The answer is uniquely both.  Sam Luther, a graduate fellow in Ohio State’s Department of Materials Science and Engineering , earned top honors in Class 4 Artistic Microscopy (Color) for the 2019 International Metallographic Contest. | LEARN MORE
  • Stretching the limits of in situ microscopy with the Quattro ESEM

    The new Thermo Scientific Quattro Environmental Scanning Electron Microscope (ESEM) , with its wide range of unique research capabilities, is now fully operational. The Quattro is equipped with extensive analytical and in situ capabilities.... | LEARN MORE

Become a CEMAS User

Are you interested in gaining access to our state-of-the-art instruments and expertise? Take the next step toward becoming a CEMAS user.