FEI/Philips CM-200T TEM
The CM-200 is a general purpose 200 kV research TEM and is optimized for diffraction analysis and imaging. It has a wide gap pole-piece to allow large tilt angles of the specimen. Although it is not considered a high-resolution microscope, it is capable of 0.27nm resolution. It is equipped with a light element EDS X-ray detector and can sample areas at the 10-20nm scale.
Features of the CM-200 include:
- 200 kV accelerating voltage with LaB6 cathode
- Fine Probe and Convergent Beam Electron Diffraction (CBED)
- 2.7 Å resolution (twin lens) with ±70˚ sample tilt (±45˚ on second tilt)
- Light Element EDS X-ray detector with digital beam control
- Gatan Imaging Filter (GIF) for PEELS spectroscopy and Energy-Filtered Imaging
- Double-tilt, Heating, and Cryo stages for specialized experiments