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Scanning Electron Microscope (SEM)

CEMAS has three scanning electron microscopes (SEM), providing many options for students, researchers, and industrial partners to analyze and investigate their materials-related issues.

Every SEM is outfitted with EDAX silicon-drift x-ray detectors, capable of very high count rates for rapid compositional analysis of specimens, enabling elemental mapping of specimens in minutes, rather than hours.

CEMAS also has an EDAX high-speed Hikari electron backscatter diffraction (EBSD) camera that provides rapid crystallographic analysis of both bulk specimens and thin foils (Transmission Kikuchi Diffraction), collecting maps at speeds upwards of 100x faster than traditional EBSD cameras. Other capabilities includes the environmental SEM (ESEM), where it is possible to image specimens at raised pressures, and image hydrated specimens using the Peltier stage. Most importantly, the staff members at CEMAS have the expertise necessary to help users obtain best quality data possible, and the knowledge base to assist in its analysis.Ti-5Al-2Sn-2Zr-4Cr-4Mo Alloy micrographs using BSE imaging at 5, 10, and 15kv respectively. A lower energy beam reduces penetration depth and interaction volume, improving ability to resolve fine precipitates in backscatter electron (BSE) imaging. Note the contrast is also more binary; there are fewer shades of gray, alpha grains are darker, beta grains are lighter. At 25kV, one alpha lath can traverse nearly the entire grayscale. Jonathan Orsborn, backscatter electron imaging of Ti-5Al-2Sn-2Zr-4Cr-4Mo using Sirion SEM.