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Scanning Electron Microscope (SEM)


CEMAS has three scanning electron microscopes (SEM), providing many options for students, researchers, and industrial partners to analyze and investigate their materials-related issues.

Every SEM is outfitted with EDAX silicon-drift x-ray detectors, capable of very high count rates for rapid compositional analysis of specimens, enabling elemental mapping of specimens in minutes, rather than hours.

CEMAS also has two EDAX high-speed Hikari electron backscatter diffraction (EBSD) cameras that provide rapid crystallographic analysis of both bulk specimens and thin foils (Transmission Kikuchi Diffraction), collecting maps at speeds upwards of 100x faster than traditional EBSD cameras. Other capabilities include raised pressure imaging and Scanning Transmission Electron Microscopy (STEM) imaging. Most importantly, the staff members at CEMAS have the expertise necessary to help users obtain best quality data possible, and the knowledge base to assist in its analysis.

Sn spheres on carbon, images of identical area with different detectors – T1, T2, and T3Sn spheres on carbon, images of identical area with different detectors – T1, T2, and T3. Image taken on Apreo SEM.