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HeliScan microCT


 

HeliScan™ uses advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity on larger volumes. As part of a multi-scale imaging solution, HeliScan™ enables scientists to gain valuable insight from internal structures to explore and validate a wide range of material properties.

The variety of materials that can be easily characterized in this system range from biological specimens to dense metallic, even micro-electronics. The ease of use as well as the high throughput make this system ideal for laboratory groups that need to identify what is within their material (voids, cracks, solutes) without requiring a sacrificial specimen.

HeliScanKey Features:

  • Accurate segmentation:

HeliScan is the only microCT system specifically designed for quantification of high-quality, geometrically precise images.

  • Fast throughput, high-quality analysis:

Helical scanning and a large cone angle combined with proprietary autofocus and drift correction delivers the highest signal-to-noise ratio. Efficient scans of representative volumes provide ready-to-segment raw data that reduces the need for digital manipulation.

  • Advanced Imaging for Quantitative Analysis:

Maintaining the true microstructure of the sample combined with the highest signal-to-noise ratio imaging available in the microCT market provides an ideal solution for quantitative analysis for any sample.

  • Process, Analyze, and Visualize Samples:

The HeliScan is the only microCT system to offer the industry standard Avizo 2D and 3D visualization software program for interactive exploration, segmentation and in-depth analysis for Materials Science sample data. Avizo provides scientists with a powerful tool to accurately explore and characterize reconstructed 3D metallic impact weld courtesy of the Glenn Daehn groupMetallic impact weld courtesy of Daehn groupmicroCT images.

  • Multi-Scale Workflow:

This microCT instrument is a valuable component of a multi-scale, multimodal workflow that may progress through higher-resolution imaging with a focused ionbeam/scanning electron microscope to atomic-scale analysis in a transmission electron microscope. All of these techniques are readily available at CEMAS.

 

Specifications:

Homework board for the ECE departmentHomework board for the ECE department

  • X-ray source: 20 – 160kV, power 8W
  • X-ray detector: 3072 x 3072 pixels, 16 bit, flat panel
  • Spatial resolution: 800 nm**
  • Sample diameter up to 240 mm
  • Load capacity: 15 kg
  • Sample stage
  • Y-range:
  • Source – Stage: 400 mm
  • Source – Detector: 750 mm
  • Z-range: 195 mm
  • R-range: 360° continuous

**(2d) Spatial resolution (or 10% MTF resolution)

Resolution is the distance between objects (or cavities) at which they can still be identified as independent from each other in an image.

Example of the 3D visualization capable using the Avizo™ softwareExample of the 3D visualization capable using the Avizo™ software