The Titan3 80-300 Probe-Corrected Monochromated (S)TEM is a state of the art system for the highest spatial resolution nanoanalysis.
The image-corrected Titan3™ G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy.
The CM-200 is a general purpose research TEM and is optimized for diffraction analysis and imaging.
The FEI Sirion Scanning Electron Microscope (SEM) is a high-resolution instrument with an electron beam voltage range from 200V – 30kV.
The XL-30 ESEM combines a high-brightness FEG source with a conventional electron column.
The Quanta200 is a flexible, simple-to-use,general purpose tungsten source SEM.
The Helios DB-FIB has an extremely high resolution L-STAR electron column with a FEG electron source.
The Nova NanoLab™ DualBeam FIB has high resolution electron (1.5nm) and ion (5nm) columns.