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Capabilities


Instruments

FEI Probe Corrected Titan3  FEG S/TEM

The Titan3 80-300 Probe-Corrected Monochromated (S)TEM is a state of the art system for the highest spatial resolution nanoanalysis.

Titan

FEI Image Corrected Titan3 S/TEM

The image-corrected Titan3™ G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy.

Titan

FEI Tecnai F20 S/TEM

The Tecnai F20 system is a field emission 200kV S/TEM with an X-TWIN lens.

FEI/Philips CM-200T TEM

The CM-200 is a general purpose research TEM and is optimized for diffraction analysis and imaging. 

FEI/Philips Sirion Field Emission SEM

The FEI Sirion Scanning Electron Microscope (SEM) is a high-resolution instrument with an electron beam voltage range from 200V – 30kV.  

FEI/Philips XL-30 Field Emission ESEM

The XL-30 ESEM combines a high-brightness FEG source with a conventional electron column.

FEI Quanta 200 SEM

The Quanta200 is a flexible, simple-to-use,general purpose tungsten source SEM.

FEI Helios NanoLab 600 DualBeam (FIB/SEM)

The Helios DB-FIB has an extremely high resolution L-STAR electron column with a FEG electron source.

 

FEI Nova NanoLab600 DualBeam (FIB/SEM)

The Nova NanoLab™ DualBeam FIB has high resolution electron (1.5nm) and ion (5nm) columns.