Driving innovation in semiconductor and microelectronic devices
CEMAS helps researchers and professionals in the semiconductor industry continue to create more advanced, autonomous semiconductors that are more efficient and secure. Working with our industry partners, we're challenging the current characterization limits to drive semiconductor innovation.
Electron microscopy plays a significant role in characterizing and evaluating materials to produce high-quality semiconductors. CEMAS collaborates with industrial partners to leverage quantitative data to improve semiconductor manufacturing processes and propel innovation, while guiding process development and providing an invaluable opportunity to capture mission critical insights through imaging and analysis for advancement of high-performance semiconductors designed to perform in every environment.
CEMAS houses one of the largest concentrations of electron microscopy instruments in any North American institution. We offer a full-service, expertly designed environment for industry partners to execute their entire microscopy analysis programs – from extensive sample preparation to image processing tools complemented by staff support.
Our custom-designed remote capabilities also allow industrial researchers an opportunity to observe our instruments in full resolution from any high-speed internet enabled device and collaborate with CEMAS’s expert staff in real time to ensure accurate and efficient data collection. Samples can be shipped to CEMAS, reducing the need for travel and providing significant cost savings.
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Semiconductor Materials Characterization
- ESD compliance testing
- Efficient pathfinding
- Advanced imaging and analysis
- Layer-by-layer device de-processing
- Laser ablation
- Maximizing yield in the shortest time possible
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As the size of semiconductors continue to dwindle, it is imperative to use advanced imaging techniques to see faults. From simple tasks to advanced failure analysis techniques that require extremely precise voltage-contrast measurements on complex devices, scanning electron microscopy (SEM) imaging can provide you with a large variety of critical data for semiconductors. Cathodoluminescence imaging and electron-beam-induced current can be conducted in the Thermo Scientific Quattro ESEM to do defect analysis on semiconductors.