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David McComb

  • Professor & Ohio Res. Scholar, Materials Science Engineering
  • Center for Electron Microscopy and Analysis
    1305 Kinnear Road
    Columbus, OH 43212

About

Professor David McComb is the Director of the Center for Electron Microscopy and Analysis (CEMAS), an Ohio Research Scholar and Professor of Materials Science and Engineering at The Ohio State University.  A chemistry graduate from the University of Glasgow, David completed his PhD in Physics at the University of Cambridge.  David is an expert in the development and application of electron energy-loss spectroscopy (EELS) as a sub-nanometer scale probe of chemistry, structure and bonding.  He has extensive experience in the application of EELS to the study of problems in solid-state chemistry and materials science including structural and compositional variations in high-k oxides, short range magnetic order in transition metal oxides, interfaces in fuel cells, photovoltaics, multiferroics and biomaterials. In recent years he has focused his attention on developing and implementing approaches to studying organic and molecular systems using these methods.  He has demonstrated that these methods can be used to obtain unique insights into materials such on polymers for organic photovoltaics, biomineralized tissues, amyloid plaques, wear particles in macrophage cells associated with metal hip implants, molecular fragments associated with degradation of carbon nanotubes in cells and mechanisms for early stage mineralization processes.  He is a fellow of the Royal Society of Chemistry and the Institute of Materials, and until recently was co-director of the London Centre for Nanotechnology as well as Director of Research and Deputy Head of the Department of Materials at Imperial College London.  In October 2011, he joined The Ohio State University as the founding director of the Center for Electron Microscopy and AnalysiS (CEMAS).  This multidisciplinary facility will drive the application of state of the art electron microscopy techniques to strategic research challenges in the physical, engineering, life and medical sciences at OSU and beyond

Honors

  • October, 2011

    Adjunct Professor.

  • January, 2006

    Rector's Award.

  • January, 2004

    Honorary Research Fellow.

  • January, 1993

    Innovation in research prize.

  • January, 1990-
    January, 1992

    Research Fellowship.

  • January, 1990-
    January, 1992

    Research Fellow.

Journal Articles

2015

  • Sarwar,A,TMGolam; Carnevale,Santino,D; Kent,Thomas,F; Yang,Fan; McComb,David,W; Myers,Roberto,C, 2015, "Tuning the polarization-induced free hole density in nanowires graded from GaN to AlN." APPLIED PHYSICS LETTERS 106, no. 3, 032102 - 032102.
  • Erhard,N; Sarwar,A,TMGolam; Yang,F; McComb,D,W; Myers,R,C; Holleitner,A,W, 2015, "Optical Control of Internal Electric Fields in Band Gap-Graded InGaN Nanowires." NANO LETTERS 15, no. 1, 332-338 - 332-338.
  • Carnevale,Santino,D; Deitz,Julia,I; Carlin,John,A; Picard,Yoosuf,N; McComb,David,W; De Graef,Marc; Ringel,Steven,A; Grassman,Tyler,J, 2015, "Applications of Electron Channeling Contrast Imaging for the Rapid Characterization of Extended Defects in III-V/Si Heterostructures." IEEE JOURNAL OF PHOTOVOLTAICS 5, no. 2, 676-682 - 676-682.

2013

  • Menzel,Robert; Duerrbeck,Andre; Liberti,Emanuela; Yau,Hin,Chun; McComb,David; Shaffer,Milo,SP, 2013, "Determining the Morphology and Photocatalytic Activity of Two-Dimensional Anatase Nanoplatelets Using Reagent Stoichiometry." CHEMISTRY OF MATERIALS 25, no. 10, 2137-2145 - 2137-2145.

2011

  • McGilvery,Catriona,M; McComb,David,W; De Gendt,Stefan; Payzant,E,Andrew; Mackenzie,Maureen; Craven,Alan,J, 2011, "Characterization of Hafnia Powder Prepared from an Oxychloride Sol-Gel." JOURNAL OF THE AMERICAN CERAMIC SOCIETY 94, no. 3, 886-894 - 886-894.

2010

  • Cavallaro,Andrea; Burriel,Monica; Roqueta,Jaume; Apostolidis,Alexandra; Bernardi,Alessandro; Tarancon,Albert; Srinivasan,Rajagopalan; Cook,Stuart,N; Fraser,Hamish,L; Kilner,John,A; McComb,David,W; Santiso,Jose, 2010, "Electronic nature of the enhanced conductivity in YSZ-STO multilayers deposited by PLD." SOLID STATE IONICS 181, no. 13-14, 592-601 - 592-601.
  • Jantou-Morris,V; Horton,Michael,A; McComb,David,W, 2010, "The nano-morphological relationships between apatite crystals and collagen fibrils in ivory dentine." BIOMATERIALS 31, no. 19, 5275-5286 - 5275-5286.
  • An, Y; Skinner, SJ; McComb, DW, 2010, "Template-assisted fabrication of macroporous thin films for solid oxide fuel cells." JOURNAL OF MATERIALS CHEMISTRY 20, no. 2, 248-254 - 248-254.
  • Wang, H; Mauthoor, S; Din, S; Gardener, JA; Chang, R; Warner, M; Aeppli, G; McComb, DW; Ryan, MP; Wu, W; Fisher, AJ; Stoneham, M; Heutz, S, 2010, "Ultra long Copper Phthalocyanine Nanowires with New Crystal Structure and Broad Optical Absorption." ACS NANO 4, no. 7, 3921-3926 - 3921-3926.
  • Clarke, E; Howe, P; Taylor, M; Spencer, P; Harbord, E; Murray, R; Kadkhodazadeh, S; McComb, DW; Stevens, BJ; Hogg, RA, 2010, "Persistent template effect in InAs/GaAs quantum dot bilayers." JOURNAL OF APPLIED PHYSICS 107, no. 11,
  • Eustace, DA; McComb, DW; Craven, AJ, 2010, "Probing magnetic order in EELS of chromite spinels using both multiple scattering (FEFF8.2) and DFT (WIEN2k)." MICRON 41, no. 6, 547-553 - 547-553.
  • Ayub,Mariam; Ivanov,Aleksandar; Instuli,Emanuele; Cecchini,Michael; Chansin,Guillaume; McGilvery,Catriona; Hong,Jongin; Baldwin,Geoff; McComb,David; Edel,Joshua,B; Albrecht,Tim, 2010, "Nanopore/electrode structures for single-molecule biosensing." ELECTROCHIMICA ACTA 55, no. 27, 8237-8243 - 8237-8243.

2009

  • Moore, JD; Cohen, LF; Yeshurun, Y; Caplin, AD; Morrison, K; Yates, KA; McGilvery, CM; Perkins, JM; McComb, DW; Trautmann, C; Ren, ZA; Yang, J; Lu, W; Dong, XL; Zhao, ZX, 2009, "The effect of columnar defects on the pinning properties of NdFeAsO0.85 conglomerate particles." SUPERCONDUCTOR SCIENCE & TECHNOLOGY 22, no. 12,
  • Thomson, NR; McLachlan, MA; Bower, CL; McComb, DW, 2009, "Formation of Patterned Arrays of Polystyrene Colloidal Crystal Structures on Flexible Functional Substrates." LANGMUIR 25, no. 19, 11344-11350 - 11344-11350.
  • Jantou,V; Turmaine,M; West,G,D; Horton,M,A; McComb,D,W, 2009, "Focused ion beam milling and ultramicrotomy of mineralised ivory dentine for analytical transmission electron microscopy." MICRON 40, no. 4, 495-501 - 495-501.
  • Breeze,Jonathan,D; Perkins,James,M; McComb,David,W; Alford,Neil,McN, 2009, "Do Grain Boundaries Affect Microwave Dielectric Loss in Oxides?." JOURNAL OF THE AMERICAN CERAMIC SOCIETY 92, no. 3, 671-674 - 671-674.
  • MacLaren, I; Ras, T; MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2009, "Texture, Twinning, and Metastable "Tetragonal" Phase in Ultrathin Films of HfO2 on a Si Substrate." JOURNAL OF THE ELECTROCHEMICAL SOCIETY 156, no. 8, G103-G108 - G103-G108.
  • Lackner,D; Pitts,O,J; Najmi,S; Sandhu,P; Kavanagh,K,L; Yang,A; Steger,M; Thewalt,M,LW; Wang,Y; McComb,D,W; Bolognesi,C,R; Watkins,S,P, 2009, "Growth of InAsSb/InAs MQWs on GaSb for mid-IR photodetector applications." JOURNAL OF CRYSTAL GROWTH 311, no. 14, 3563-3567 - 3563-3567.
  • Zhu,Rong; McLachlan,Martyn; Reyntjens,Steve; Tariq,Farid; Ryan,Mary,P; McComb,David,W, 2009, "Controlling the electrodeposition of mesoporous metals for nanoplasmonics." NANOSCALE 1, no. 3, 355-359 - 355-359.
  • Koh,Ai,Leen; Bao,Kui; Khan,Imran; Smith,W,Ewen; Kothleitner,Gerald; Nordlander,Peter; Maier,Stefan,A; McComb,David,W, 2009, "Electron Energy-Loss Spectroscopy (EELS) of Surface Plasmons in Single Silver Nanoparticles and Dimers: Influence of Beam Damage and Mapping of Dark Modes." ACS NANO 3, no. 10, 3015-3022 - 3015-3022.
  • Bland, PA; Jackson, MD; Coker, RF; Cohen, BA; Webber, JBW; Lee, MR; Duffy, CM; Chater, RJ; Ardakani, MG; McPhail, DS; McComb, DW; Benedix, GK, 2009, "Why aqueous alteration in asteroids was isochemical: High porosity not equal high permeability." EARTH AND PLANETARY SCIENCE LETTERS 287, no. 3-4, 559-568 - 559-568.

2008

  • Moore,J,D; Morrison,K; Yates,K,A; Caplin,A,D; YESHURUN,Y; Cohen,L,F; Perkins,J,M; McGilvery,C,M; McComb,D,W; Ren,Z,A; Yang,J; Lu,W; Dong,X,L; Zhao,Z,X, 2008, "Evidence for supercurrent connectivity in conglomerate particles in NdFeAsO1-delta." SUPERCONDUCTOR SCIENCE & TECHNOLOGY 21, no. 9, 092004 - 092004.
  • McGilvery,C,M; McFadzean,S; MacKenzie,M; Docherty,F,T; Craven,A,J; McComb,D,W; De Gendt,S, 2008, "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 325-328 - 325-328.
  • Jasper, A; Kilner, JA; McComb, DW, 2008, "TEM and impedance spectroscopy of doped ceria electrolytes." SOLID STATE IONICS 179, no. 21-26, 904-908 - 904-908.
  • Wang,Y,Q; Nikitin,K; McComb,D,W, 2008, "Fabrication of Au-Cu2O core-shell nanocube heterostructures." CHEMICAL PHYSICS LETTERS 456, no. 4-6, 202-205 - 202-205.
  • MacKenzie,M; Craven,A,J; McComb,D,W; McGilvery,C,M; McFadzean,S; De Gendt,S, 2008, "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 313-316 - 313-316.
  • Khokhar,A,Z; De La Rue,R,M; Treble,B,M; McComb,D,W; Johnson,N,P, 2008, "Stibnite inverse opal." MICRO & NANO LETTERS 3, no. 1, 1-6 - 1-6.
  • Eustace,D,A; McComb,D,W; Buckle,L; Buckle,P; Ashley,T; Singh,L,J; Barber,Z,H; Gilbertson,A,M; Branford,W,R; Clowes,S,K; Cohen,L,F, 2008, "(S)TEM Characterisation of InAs/MgO/Co Multilayers." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 153-156 - 153-156.
  • Harkins, P; MacKenzie, M; Craven, AJ; McComb, DW, 2008, "Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate." MICRON 39, no. 6, 709-716 - 709-716.
  • Schaeffer,Nicolas; Tan,Bien; Dickinson,Calum; Rosseinsky,Matthew,J; Laromaine,Anna; McComb,David,W; Stevens,Molly,M; Wang,Yiqian; Petit,Laure; Barentin,Catherine; Spiller,David,G; Cooper,Andrew,I; Levy,Raphael, 2008, "Fluorescent or not? Size-dependent fluorescence switching for polymer-stabilized gold clusters in the 1.1-1.7 nm size range." CHEMICAL COMMUNICATIONS 1, no. 34, 3986-3988 - 3986-3988.
  • Docherty, FT; MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S; McFadzean, S; McGilvery, CM, 2008, "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." MICROELECTRONIC ENGINEERING 85, no. 1, 61-64 - 61-64.
  • Craven,A,J; MacKenzie,M; McComb,D,W, 2008, "Nanoanalysis of high-k dielectrics on semiconductors." IPFA 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS 1, 269-274 - 269-274.
  • Craven,A,J; MacKenzie,M; McComb,D,W, 2008, "Nanoanalysis of high-k dielectrics on semiconductors." IPFA 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS 1, 269-274 - 269-274.
  • Li, WX; Fenton, JC; Wang, YQ; McComb, DW; Warburton, PA, 2008, "Tunability of the superconductivity of tungsten films grown by focused-ion-beam direct writing." JOURNAL OF APPLIED PHYSICS 104, no. 9,
  • McLachlana, MA; Barron, CCA; Johnson, NP; De La Rue, RM; McComb, DW, 2008, "Preparation of large area three-dimensionally ordered macroporous thin films by confined infiltration and crystallisation." JOURNAL OF CRYSTAL GROWTH 310, no. 10, 2644-2648 - 2644-2648.
  • Thomson, NR; Bower, CL; McComb, DW, 2008, "Identification of mechanisms, competing with self-assembly during directed colloidal deposition." JOURNAL OF MATERIALS CHEMISTRY 18, no. 21, 2500-2505 - 2500-2505.

2007

  • McLachlan, MA; McComb, DW; Berhanu, S; Jones, TS, 2007, "Template directed synthesis of nanostructured phthalocyanine thin films." JOURNAL OF MATERIALS CHEMISTRY 17, no. 36, 3773-3776 - 3773-3776.
  • Barron, CCA; McLachlan, M; Zhang, Q; McComb, DW, 2007, "Ferroelectric three-dimensionally ordered macroporous thin films." INTEGRATED FERROELECTRICS 92, 43-52 - 43-52.
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S; Docherty, FT; McGilvery, CM; McFadzean, S, 2007, "Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation." ELECTROCHEMICAL AND SOLID STATE LETTERS 10, no. 6, G33-G35 - G33-G35.
  • Magnus, F; Clowes, SK; Gilbertson, AM; Branford, WR; Barkhoudarov, ED; Cohen, LF; Singh, LJ; Barber, ZH; Blamire, MG; Buckle, PD; Buckle, L; Ashley, T; Eustace, DA; McComb, DW, 2007, "Electrical characterization of MgO tunnel barriers grown on InAs (001) epilayers." APPLIED PHYSICS LETTERS 91, no. 12,
  • Barquin,L,Fernandez; Calderon,R,Garcia; Farago,B; Rodriguez-Carvajal,J; Bleloch,A; McComb,D; Chater,R; Pankhurst,Q,A, 2007, "Neutron spin echo evidence of mesoscopic spin correlations among Fe(Cu) ferromagnetic nanoparticles in a silver diamagnetic matrix." PHYSICAL REVIEW B 76, no. 17, 172404 - 172404.
  • Singh, LJ; Oliver, RA; Barber, ZH; Eustace, DA; McComb, DW; Clowes, SK; Gilbertson, AM; Magnus, F; Branford, WR; Cohen, LF; Buckle, L; Buckle, PD; Ashley, T, 2007, "Preparation of InAs(001) surface for spin injection via a chemical route." JOURNAL OF PHYSICS D-APPLIED PHYSICS 40, no. 10, 3190-3193 - 3190-3193.

2006

  • Mackenzie,M; Craven,A,J; Hamilton,D,A; McComb,D,W, 2006, "Electron energy-loss spectrum imaging of high-k dielectric stacks." APPLIED PHYSICS LETTERS 88, no. 2, 022108 - 022108.
  • Mackenzie,M; Craven,A,J; McComb,D,W; De Gendt,S, 2006, "Interfacial reactions in a HfO2/TiN/poly-Si gate stack." APPLIED PHYSICS LETTERS 88, no. 19, 192112 - 192112.
  • Khan, I; Cunningham, D; Littleford, RE; Graham, D; Smith, WE; McComb, DW, 2006, "From micro to nano: Analysis of surface-enhanced resonance Raman spectroscopy active sites via multiscale correlations." ANALYTICAL CHEMISTRY 78, no. 1, 224-230 - 224-230.
  • Khan, IR; Cunningham, D; Lazar, S; Graham, D; Smith, WE; McComb, DW, 2006, "A TEM and electron energy loss spectroscopy (EELS) investigation of active and inactive silver particles for surface enhanced resonance Raman spectroscopy (SERRS)." FARADAY DISCUSSIONS 132, 171-178 - 171-178.
  • T Docherty,F; MacKenzie,M; Pennicard,D; Craven,A,J; McComb,D,W, 2006, "Understanding and preventing beam damage effects in partially processed high-k gate stacks." EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE 26, 231-234 - 231-234.
  • Eustace,D,A; Docherty,F,T; McComb,D,W; Craven,A,J, 2006, "ELNES as a probe of magnetic order in mixed oxides." EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE 26, 165-168 - 165-168.
  • Cunningham, D; Littleford, RE; Smith, WE; Lundahl, PJ; Khan, I; McComb, DW; Graham, D; Laforest, N, 2006, "Practical control of SERRS enhancement." FARADAY DISCUSSIONS 132, 135-145 - 135-145.
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2006, "Interfacial reactions in a HfO2/TiN/poly-Si gate stack." APPLIED PHYSICS LETTERS 88, no. 19,
  • Litvinenko, KL; Murdin, BN; Allam, J; Pidgeon, CR; Zhang, T; Harris, JJ; Cohen, LF; Eustace, DA; McComb, DW, 2006, "Spin lifetime in InAs epitaxial layers grown on GaAs." PHYSICAL REVIEW B 74, no. 7,
  • Jin, CJ; Li, ZY; McLachlan, MA; McComb, DW; De La Rue, RM; Johnson, NP, 2006, "Optical properties of tetragonal photonic crystal synthesized via template-assisted self-assembly." JOURNAL OF APPLIED PHYSICS 99, no. 11,
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2006, "Advanced nanoanalysis of high-k dielectric stacks." JOURNAL OF THE ELECTROCHEMICAL SOCIETY 153, no. 9, F215-F218 - F215-F218.

2005

  • McLachlan, MA; Johnson, NP; De La Rue, R; McComb, DW, 2005, "Domain size and thickness control of thin film photonic crystals." JOURNAL OF MATERIALS CHEMISTRY 15, no. 3, 369-371 - 369-371.
  • Littleford,R,E; Cunningham,D; Matousek,P; Towrie,M; Parker,A,W; Khan,I; McComb,D; Smith,W,E, 2005, "Surface-enhanced resonance Raman scattering using pulsed and continuous-wave laser excitation." JOURNAL OF RAMAN SPECTROSCOPY 36, no. 6-7, 600-605 - 600-605.
  • Craven, AJ; MacKenzie, M; McComb, DW; Docherty, FT, 2005, "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." MICROELECTRONIC ENGINEERING 80, 90-97 - 90-97.
  • Jin,C,J; McLachlan,M,A; McComb,D,W; De La Rue,R,M; Johnson,N,P, 2005, "Template-assisted growth of nominally cubic (100)-oriented three-dimensional crack-free photonic crystals." NANO LETTERS 5, no. 12, 2646-2650 - 2646-2650.
  • Khan, I; Cunningham, D; Graham, D; McComb, DW; Smith, WE, 2005, "Identification and characterization of active and inactive species for surface-enhanced resonance Raman scattering." JOURNAL OF PHYSICAL CHEMISTRY B 109, no. 8, 3454-3459 - 3454-3459.
  • Hobbs, L; Eddie, I; Erwin, G; Bryce, AC; De la Rue, RM; Roberts, JS; Krauss, TF; Mccomb, DW; Mackenzie, M, 2005, "Reprocessing of thermally oxidized aluminum arsenide (AlAs) in epitaxial multilayers without delamination." JOURNAL OF ELECTRONIC MATERIALS 34, no. 3, 232-239 - 232-239.
  • MacKenzie, M; Weatherly, GC; McComb, DW; Craven, AJ, 2005, "Electron energy loss spectroscopy of a TiAlN coating on stainless steel." SCRIPTA MATERIALIA 53, no. 8, 983-987 - 983-987.

2004

  • Hamilton, DA; Craven, AJ; MacKenzie, M; McComb, DW, 2004, "Understanding gate oxide materials: ELNES of Hf and Zr compounds." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 79-82 - 79-82.
  • MacKenzie, M; Craven, AJ; McComb, DW; Hamilton, DA; McFadzean, S, 2004, "Spectrum imaging of high-k dielectric stacks." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 299-302 - 299-302.
  • Ross, IM; Rainforth, WM; Scott, AJ; Brown, AP; Brydson, R; McComb, DW, 2004, "Electron energy-loss spectroscopy (EELS) studies of an yttria stabilized TZP ceramic." JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 24, no. 7, 2023-2029 - 2023-2029.
  • Harkins, P; McComb, DW; MacKenzie, M; Craven, AJ, 2004, "ELNES of titanate perovskites - a probe of structure and bonding." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 119-122 - 119-122.
  • McComb, DW; Craven, AJ; Hamilton, DA; MacKenzie, M, 2004, "Probing local coordination environments in high-k materials for gate stack applications." APPLIED PHYSICS LETTERS 84, no. 22, 4523-4525 - 4523-4525.
  • McLachlan,M,A; Johnson,N,P; De La Rue,R,M; McComb,D,W, 2004, "Thin film photonic crystals: synthesis and characterisation." JOURNAL OF MATERIALS CHEMISTRY 14, no. 2, 144-150 - 144-150.
  • Khan, I; Polwart, E; McComb, DW; Smith, WE, 2004, "Correlation of optical properties with structure of immoblised nanoparticles - a method for probing the mechanism of SERRS." ANALYST 129, no. 10, 950-955 - 950-955.

2003

  • Haswell,R; McComb,D,W; Smith,W, 2003, "Preparation of site-specific cross-sections of heterogeneous catalysts prepared by focused ion beam milling." JOURNAL OF MICROSCOPY-OXFORD 211, 161-166 - 161-166.

2002

  • Ostanin, S; Salamatov, E; Craven, AJ; McComb, DW; Vlachos, D, 2002, "Theory of the phases and atomistic structure of yttria-doped zirconia." PHYSICAL REVIEW B 66, no. 13,
  • Ostanin, S; Craven, AJ; McComb, DW; Vlachos, D; Alavi, A; Paxton, AT; Finnis, MW, 2002, "Electron energy-loss near-edge shape as a probe to investigate the stabilization of yttria-stabilized zirconia." PHYSICAL REVIEW B 65, no. 22,

2001

  • Vlachos,D; Craven,A,J; McComb,D,W, 2001, "The influence of dopant concentration on the oxygen K-edge ELNES and XANES in yttria-stabilized zirconia." JOURNAL OF PHYSICS-CONDENSED MATTER 13, no. 48, 10799-10809 - 10799-10809.
  • Ross, IM; Rainforth, WM; McComb, DW; Scott, AJ; Brydson, R, 2001, "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 299-302 - 299-302.
  • Ross, IM; Rainforth, WM; McComb, DW; Scott, AJ; Brydson, R, 2001, "The role of trace additions of alumina to yttria-tetragonal zirconia polycrystals (Y-TZP)." SCRIPTA MATERIALIA 45, no. 6, 653-660 - 653-660.
  • Maclean, EDW; Craven, AJ; McComb, DW, 2001, "Valence losses at interfaces in aluminium alloys." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 259-262 - 259-262.
  • Ross, IM; Rainforth, WM; Scott, AJ; Brown, AP; Brydson, R; McComb, DW, 2001, "Differentiation of zirconia polymorphs using EELS and ELNES." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 303-306 - 303-306.
  • Kealey, CP; Klapotke, TM; McComb, DW; Robertson, MI; Winfield, JM, 2001, "Fluorination of polycrystalline diamond films and powders. An investigation using FTIR spectroscopy, SEM, energy-filtered TEM, XPS and fluorine-18 radiotracer methods." JOURNAL OF MATERIALS CHEMISTRY 11, no. 3, 879-886 - 879-886.
  • Docherty, FT; Craven, AJ; McComb, DW; Skakle, J, 2001, "ELNES investigations of the oxygen K-edge in spinels." ULTRAMICROSCOPY 86, no. 3-4, 273-288 - 273-288.
  • MacKenzie, M; Weatherly, GC; McComb, DW; Perovic, A; Craven, AJ, 2001, "Interfacial reaction products in Al-based metal-matrix composites." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 283-286 - 283-286.
  • McComb, DW; Treble, BM; Smith, CJ; De La Rue, RM; Johnson, NP, 2001, "Synthesis and characterisation of photonic crystals." JOURNAL OF MATERIALS CHEMISTRY 11, no. 1, 142-148 - 142-148.
  • Johnson, NP; McComb, DW; Richel, A; Treble, BM; De la Rue, RM, 2001, "Synthesis and optical properties of opal and inverse opal photonic crystals." SYNTHETIC METALS 116, no. 1-3, 469-473 - 469-473.

2000

  • Richel,A; Johnson,N,P; McComb,D,W, 2000, "Observation of Bragg reflection in photonic crystals synthesized from air spheres in a titania matrix." APPLIED PHYSICS LETTERS 76, no. 14, 1816-1818 - 1816-1818.
  • Richel, A; Johnson, NP; McComb, DW, 2000, "Observation of Bragg reflection in photonic crystals synthesized from air spheres in a titania matrix (vol 76, pg 1816, 2000)." APPLIED PHYSICS LETTERS 77, no. 7, 1062-1063 - 1062-1063.
  • Ostanin,S; Craven,A,J; McComb,D,W; Vlachos,D; Alavi,A; Finnis,M,W; Paxton,A,T, 2000, "Effect of relaxation on the oxygen K-edge electron energy-loss near-edge structure in yttria-stabilized zirconia." PHYSICAL REVIEW B 62, no. 22, 14728-14735 - 14728-14735.
  • McComb,D,W; Ning,X,G; Weatherly,G,C; Pan,J; Lloyd,D,J, 2000, "Interfacial reaction chemistry in Al-based metal-matrix composites." PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES 80, no. 11, 2509-2527 - 2509-2527.

1999

  • Docherty, FT; Craven, AJ; McComb, DW, 1999, "ELNES investigations of the structure and electronic properties of chromium spinels." ELECTRON MICROSCOPY AND ANALYSIS 1999 no. 161, 203-206 - 203-206.

1998

  • Piva, PG; Goldberg, RD; Mitchell, IV; Chen, HJ; Feenstra, RM; Weatherly, GC; McComb, DW; Aers, GC; Poole, PJ; Charbonneau, S, 1998, "A comparison of spectroscopic and microscopic observations of ion-induced intermixing in InGaAs/InP quantum wells." APPLIED PHYSICS LETTERS 72, no. 13, 1599-1601 - 1599-1601.

1997

  • McComb, DW; Weatherly, GC, 1997, "The effect of secondary electrons generated in a commercial FEG-TEM on electron energy-loss spectra." ULTRAMICROSCOPY 68, no. 1, 61-67 - 61-67.
  • Yang, W; Weatherly, GC; McComb, DW; Lloyd, DJ, 1997, "The structure of SiC-reinforced Mg casting alloys." JOURNAL OF MICROSCOPY-OXFORD 185, 292-302 - 292-302.
  • Perovic, DD; Bahierathan, B; Lafontaine, H; Houghton, DC; McComb, DW, 1997, "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." PHYSICA A 239, no. 1-3, 11-17 - 11-17.
  • Okada, T; Weatherly, GC; McComb, DW, 1997, "Growth of strained InGaAs layers on InP substrates." JOURNAL OF APPLIED PHYSICS 81, no. 5, 2185-2196 - 2185-2196.

1996

  • McComb, DW; Collings, BA; Wolkow, RA; Moffatt, DJ; MacPherson, CD; Rayner, DM; Hackett, PA; Hulse, JE, 1996, "An atom-resolved view of silicon nanoclusters." CHEMICAL PHYSICS LETTERS 251, no. 1-2, 8-12 - 8-12.
  • McComb,D,W, 1996, "Bonding and electronic structure in zirconia pseudopolymorphs investigated by electron energy-loss spectroscopy." PHYSICAL REVIEW B 54, no. 10, 7094-7102 - 7094-7102.
  • McComb, DW; Okada, T; Weatherly, GC; Wolkow, RA; Hulse, JE, 1996, "Cross-sectional transmission electron microscopy and scanning tunnelling microscopy applied to investigation of phase segregation in III-V multilayers grown by molecular beam epitaxy." PHILOSOPHICAL MAGAZINE LETTERS 73, no. 3, 129-136 - 129-136.

1995

  • MCCOMB, DW; HOWIE, A, 1995, "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 96, no. 3-4, 569-574 - 569-574.
  • MCCOMB, DW; WOLKOW, RA; MOFFATT, DJ; HACKETT, PA, 1995, "ON THE STRUCTURE AND STABILITY OF SI(111)-(7X7) FRAGMENTS CREATED DURING GROWTH OF AG/SI(111)-(ROOT-3X-ROOT-3)." SURFACE SCIENCE 340, no. 1-2, L955-L959 - L955-L959.

1994

  • WILLIAMS, BR; MASON, BF; MCCOMB, DW; MOFFATT, DJ; HACKETT, PA, 1994, "A SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF THE REACTION OF HYDROGEN-ATOMS WITH AG/SI(111)-(ROOT-X-ROOT-3." SURFACE SCIENCE 313, no. 1-2, L790-L796 - L790-L796.
  • MCCOMB, DW; MOFFATT, DJ; HACKETT, PA; WILLIAMS, BR; MASON, BF, 1994, "SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF THE NUCLEATION AND GROWTH OF AG/SI(111)-(ROOT-3X-ROOT-3)." PHYSICAL REVIEW B 49, no. 24, 17139-17148 - 17139-17148.
  • HANSEN, PL; BRYDSON, R; MCCOMB, DW; RICHARDSON, I, 1994, "EELS FINGERPRINT OF AL-COORDINATION IN SILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 5, no. 3, 173-182 - 173-182.
  • MCCOMB, DW; WOLKOW, RA; HACKETT, PA, 1994, "DEFECTS ON THE AG/SI(111)-(ROOT-3X-ROOT-3) SURFACE." PHYSICAL REVIEW B 50, no. 24, 18268-18274 - 18268-18274.
  • BARRAS, J; KLINOWSKI, J; MCCOMB, DW, 1994, "AL-27 AND SI-29 SOLID-STATE NMR-STUDIES OF DEALUMINATED MORDENITE." JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS 90, no. 24, 3719-3723 - 3719-3723.

1993

  • Brydson,R; Richardson,I,G; McComb,D,W; Groves,G,W, 1993, "PARALLEL ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDY OF AL-SUBSTITUTED CALCIUM SILICATE HYDRATE (C-S-H) PHASES PRESENT IN HARDENED CEMENT PASTES." SOLID STATE COMMUNICATIONS 88, no. 2, 183-187 - 183-187.
  • MCGIBBON, AJ; BROWN, LM; BLELOCH, AL; BROWNING, ND; AIRES, FCS; FALLON, PJ; GASKELL, PH; GILKES, KWR; HANSEN, PL; HOWIE, A; MAYNARD, AD; MCCOMB, DW; MCMULLAN, D; MULLEJANS, H; MUROOKA, Y; PATERSON, JH; PEROVIC, DD; PIKE, WT; RAUF, IA; RODENBURG, JM; SAEED, A; STELMASHENKO, N; TU, KN; WALLS, MG; WALSH, CA; YUAN, J; ZHAO, J, 1993, "MICROSCOPY IN SOLID-STATE SCIENCE." MICROSCOPY RESEARCH AND TECHNIQUE 24, no. 4, 299-315 - 299-315.

1992

  • McComb, D.W., 1992, "Interpretation of electron energy-loss spectra of minerals." Micron And Microscopica Acta 23, no. 1-2, 197-198 - 197-198.
  • MCCOMB, DW; BRYDSON, R; HANSEN, PL; PAYNE, RS, 1992, "QUALITATIVE INTERPRETATION OF ELECTRON ENERGY-LOSS NEAR-EDGE STRUCTURE IN NATURAL ZIRCON." JOURNAL OF PHYSICS-CONDENSED MATTER 4, no. 43, 8363-8374 - 8363-8374.
  • HANSEN, PL; BRYDSON, R; MCCOMB, DW, 1992, "P -] P-LIKE TRANSITIONS AT THE SILICON L2,3-EDGES OF SILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 3, no. 2-3, 213-219 - 213-219.

1991

  • MCCOMB, DW; HANSEN, PL; BRYDSON, R, 1991, "A STUDY OF SILICON ELNES IN NESOSILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 2, no. 5, 561-568 - 561-568.

1990

  • MCCOMB, DW; HOWIE, A, 1990, "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." ULTRAMICROSCOPY 34, no. 1-2, 84-92 - 84-92.

1989

  • BUGLASS, JG; HOWIE, A; MCCOMB, DW, 1989, "APPLICATIONS OF ELECTRON-MICROSCOPY METHODS TO CATALYST PROBLEMS." CATALYSIS LETTERS 3, no. 1, 17-23 - 17-23.

Unknown

  • Pu, Y.; Wang, H.L.; Du, C.H.; Adur, R. et al., "Long-range FMR driven spin pumping through a nonmagnetic insulator."

Papers in Proceedings

2018

  • Deitz, J.I.; Paul, P.K.; Karki, S.; Marsillac, S.X. et al. "Nanoscale Electronic Structure Characterization in CIGS with Electron Energy-Loss Spectroscopy." (1 2018).
  • Deitz, J.I.; Paul, P.K.; Karki, S.; Marsillac, S.X. et al. "Nanoscale Electronic Structure Characterization in CIGS with Electron Energy-Loss Spectroscopy." in 7th IEEE World Conference on Photovoltaic Energy Conversion (WCPEC) / A Joint Conference of 45th IEEE PVSC / 28th PVSEC / 34th EU PVSEC. (1 2018).
  • Deitz, J.I.; Paul, P.K.; Karki, S.; Marsillac, S.X. et al. "Nanoscale Electronic Structure Characterization in CIGS with Electron Energy-Loss Spectroscopy." (11 2018).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the electronic structure at the heterovalent GaP/Si interface using electron energy-loss spectroscopy." (5 2018).
  • Sarkar, S.; Deng, B.; Ghatak, S.; Singh, K. et al. "Stem Tomography of Hyper Biofilm Producing Persister Pseudomonas aeruginosa." (1 2018).
  • Sarkar, S.; Deng, B.; Ghatak, S.; Singh, K. et al. "Stem Tomography of Hyper Biofilm Producing Persister Pseudomonas aeruginosa." (1 2018).

2017

  • Deitz, J.I.; Paul, P.K.; Karki, S.; Marsillac, S. et al. "Nanoscale Detection of Deep Levels in CIGS using Electron Energy Loss Spectroscopy." (1 2017).

2016

  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the electronic structure at the heterovalent GaP/Si interface using electron energy-loss spectroscopy." in 43th IEEE Photovoltaic Specialists Conference. (11 2016).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the Electronic Structure at the Heterovalent GaP/Si Interface using Electron Energy-Loss Spectroscopy." in 43rd IEEE Photovoltaic Specialists Conference (PVSC). (1 2016).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J.; IEEE, "Probing the Electronic Structure at the Heterovalent GaP/Si Interface using Electron Energy-Loss Spectroscopy." (1 2016).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the electronic structure at the heterovalent GaP/Si interface using electron energy-loss spectroscopy." (11 2016).

2015

  • Deitz,Julia,I; Carnevale,Santino,D; Ringel,Steven,A; McComb,David,W; Grassman,Tyler,J Extending Characterization Applications of Electron Channeling Contrast Imaging. in IEEE Photovoltaic Specialist Conference (PVSC). http://dx.doi.org/10.1109/pvsc.2015.7356198, (1 2015).
  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending characterization applications of electron channeling contrast imaging." (12 2015).
  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending Characterization Applications of Electron Channeling Contrast Imaging." (1 2015).
  • Deng, B.; Barki, K.G.; Ghatak, S.; Roy, S. et al. "THREE-DIMENSIONAL STRUCTURE OF THE WOUND BIOFILM." (3 2015).
  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending Characterization Applications of Electron Channeling Contrast Imaging." in IEEE 42nd Photovoltaic Specialist Conference (PVSC). (1 2015).
  • Deng, B.; Barki, K.G.; Ghatak, S.; Roy, S. et al. "THREE-DIMENSIONAL STRUCTURE OF THE WOUND BIOFILM." (1 2015).

2014

  • Scheltens, F.J.; Durstock, M.F.; Tabor, C.E.; Leever, B.J. et al. "Monochromated electron energy-loss spectroscopy spectrum imaging of organic photovoltaic devices." (1 2014).
  • Williams, R.E.A.; Carnevale, S.D.; Kent, T.F.; Stowe, D.J. et al. "Electron energy loss spectroscopy and localized cathodoluminescence characterization of GaN quantum discs." (1 2014).
  • Alexander, J.A.; Durstock, M.F.; Tabor, C.E.; Leever, B.J. et al. "Investigation of the use of stereo-pair data sets in electron tomography characterization of organic-based solar cells." (1 2014).
  • Colijn, H.O.; Yang, F.; Williams, D.B.; Sandborg, A. et al. "Performance of an improved TEM SDD detector." (1 2014).
  • Deitz, J.; Carnevale, S.; De Graef, M.; Picard, Y.N. et al. "Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films." (1 2014).
  • Goode, A.E.; Hine, N.D.M.; Chen, S.; Bergin, S.D. et al. "Electron microscopic characterization of functionalized multi-walled carbon nanotubes and their interactions with the blood brain barrier." (1 2014).
  • Channagiri, S.A.; Viswanathan, G.B.; Nichol, R.; Nagpure, S.C. et al. "Spatially resolved characterization of phases in LiFePO<inf>4</inf> battery cathodes using low loss electron energy-loss spectroscopy." (1 2014).
  • Yang, F.; Chen, Y.; Cai, Z.; Tsvetkov, N. et al. "High resolution electron microscopy characterization of (La<inf>0.5</inf>Sr<inf>0.5</inf>)<inf>2</inf>CoC<inf>4</inf> thin film cathode materials." (1 2014).
  • Deng, B.; Freria, C.M.; Williams, R.E.A.; Huber, D. et al. "3D visualization of motor-neurons in mice spinal cord using FIB\SEM tomography." (1 2014).
  • Esser, B.D.; D'Alfonso, A.J.; Dixit, M.; Williams, R.E.A. et al. "Understanding B-site disorder in HAADF-STEM images of double perovskite thin films using the quantum excitation of phonons model." (1 2014).
  • J. Deitz, S. Carnevale, M. De Graef, Y. N. Picard, S. A. Ringel, T. J. Grassman, D. W. McComb Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films. in Microscopy and Microanalysis. http://htp//dx.doi.org/10.1017/S1431927614004486, (8 2014).

2012

  • Liberti,E; McGilvery,C,M; Menzel,R; Shaffer,M,SP; McComb,D,W "Size effects in nanoscale dielectric materials." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." (8 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." (1 2012).
  • Gilchrist,J,B; Heutz,S; McComb,D,W "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." (1 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." (1 2012).
  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." (8 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." (8 2012).

2011

  • Illy, B.N.; Cruickshank, A.C.; Da Campo, R.; Schumann, S. et al. "Electrodeposition of ultrathin ZnO buffer layers with controllable orientation for photovoltaic applications." (8 2011).

2010

  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." (1 2010).
  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • Koh, A.L.; Tomanec, O.; Urbanek, M.; Sikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." (1 2010).
  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." (12 2010).
  • Koh,Ai,Leen; Tomanec,Ondrej; Urbanek,Michal; Sikola,Tomas; Maier,Stefan,A; McComb,David,W "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • McGuire,E,K; Motskin,M; Knowles,T,PJ; Dobson,C,M; McComb,D,W; Porter,A,E "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • Koh, A.L.; Tomanec, O.; Urbánek, M.; Šikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." (12 2010).
  • Koh, A.L.; Tomanec, O.; Urbanek, M.; Sikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).

2009

  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).
  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).
  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).

2008

  • Eustace, D.A.; McComb, D.W.; Buckle, L.; Buckle, P. et al. "(S)TEM Characterisation of InAs/MgO/Co Multilayers." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: a study of magnetic order." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." (9 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." (1 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." (1 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." in Conference on Organic Photovoltaics IX. (1 2008).
  • McGilvery,C,M; McFadzean,S; MacKenzie,M; Docherty,F,T; Craven,A,J; McComb,D,W; De Gendt,S "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; McGilvery, C.M. et al. "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery, C.M.; McFadzean, S.; MacKenzie, M.; Docherty, F.T. et al. "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." (1 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." (1 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." (9 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." (12 2008).
  • McLachlan, M.A.; Ying, A.; Kilner, J.A.; McComb, D.W. et al. "Engineered nanocomposites for solid oxide fuel cells by colloidal crystal templating." (12 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." (12 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." (1 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." (12 2008).
  • Zhu, R.; McLachlan, M.A.; McComb, D.W.; Ryan, M.P. "Electrochemically grown metallic inverse opals." (12 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: A study of magnetic order." (12 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." (12 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." (9 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal crystals as nanostructured templates for organic solar cells." (12 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: a study of magnetic order." (1 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." (1 2008).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; McGilvery, C.M. et al. "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." (1 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." (1 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." (1 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." (1 2008).
  • Eustace, D.A.; McComb, D.W.; Buckle, L.; Buckle, P. et al. "(S)TEM Characterisation of InAs/MgO/Co Multilayers." (1 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." (12 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." (1 2008).
  • McGilvery, C.M.; McFadzean, S.; MacKenzie, M.; Docherty, F.T. et al. "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Eustace,D,A; Cheah,W,L; McComb,D,W; Docherty,F,T; Craven,A,J "Modelling paramagnetism in EELS: a study of magnetic order." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Berhanu,Sarah; McLachlan,Martyn,A; McComb,David,W; Jones,Tim,S "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." in Conference on Organic Photovoltaics IX. (1 2008).
  • MacKenzie,M; Craven,A,J; McComb,D,W; McGilvery,C,M; McFadzean,S; De Gendt,S "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Jasper,A; Kilner,J,A; McComb,D,W "TEM and impedance spectroscopy of doped ceria electrolytes." in 16th International Conference on Solid State Ionics. (9 2008).
  • Docherty,F,T; MacKenzie,M; Craven,A,J; McComb,D,W; De Gendt,S; McFadzean,S; McGilvery,C,M "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." in IEEE International Symposium on Advanced Gate Stack Technology (ISAGST). (1 2008).
  • Jantou,V; McComb,D,W; Horton,M,A "Analytical transmission electron microscopy of mineralised dentin." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." in 16th International Conference on Solid State Ionics. (9 2008).
  • Eustace,D,A; McComb,D,W; Buckle,L; Buckle,P; Ashley,T; Singh,L,J; Barber,Z,H; Gilbertson,A,M; Branford,W,R; Clowes,S,K; Cohen,L,F "(S)TEM Characterisation of InAs/MgO/Co Multilayers." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • McGilvery,C,M; McComb,D,W; MacKenzie,M; Craven,A,J; McFadzean,S; De Gendt,S "Analysis of hafnium containing powders and thin films for CMOS device applications." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Lekstrom,M; McLachlan,M,A; Husain,S; McComb,D,W; Shollock,B,A "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Kadkhodazadeh,S; Ashwin,M,J; Jones,T,S; McComb,D,W "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." in IEEE International Symposium on Advanced Gate Stack Technology (ISAGST). (1 2008).
  • Craven,A,J; MacKenzie,M; McComb,D,W "Nanoanalysis of high-k dielectrics on semiconductors." in 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. (1 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." in 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. (1 2008).
  • Husain,S; McComb,D,W; Perkins,J,M; Haswell,R "Sample preparation and electron microscopy of hydrocracking catalysts." in Electron Microscopy and Analysis Group Conference. (1 2008).

2007

  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." (12 2007).
  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." in Minisymposium on Electro-Optic Nanoarrays. (1 2007).
  • Barron,C,CA; McLachlan,M; Zhang,Q; McComb,D,W "Ferroelectric three-dimensionally ordered macroporous thin films." in Minisymposium on Electro-Optic Nanoarrays. (1 2007).
  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." (1 2007).

2006

  • T Docherty,F; MacKenzie,M; Pennicard,D; Craven,A,J; McComb,D,W "Understanding and preventing beam damage effects in partially processed high-k gate stacks." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • T Docherty, F.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; De Gendt, S. et al. "Advanced nano-analysis of a high-k dielectric stack." (12 2006).
  • Eustace,D,A; Docherty,F,T; McComb,D,W; Craven,A,J "ELNES as a probe of magnetic order in mixed oxides." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • Docherty, F.T.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." (1 2006).
  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." (1 2006).
  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • T Docherty, F.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." (1 2006).
  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." (1 2006).

2005

  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." (6 2005).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." in 14th Biennial Conference on Insulating Films on Semiconductors. (6 2005).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." (6 2005).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; De Gendt, S. "Advanced nano-analysis of high-k dielectric stacks." (12 2005).
  • Craven,A,J; MacKenzie,M; McComb,D,W; Docherty,F,T "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." in 14th Biennial Conference on Insulating Films on Semiconductors. (6 2005).
  • Jin, C.; McLachlan, M.A.; McComb, D.W.; De La Ruea, R.M. et al. "Template-assisted self-assembly growth of (100) oriented three-dimensional photonic crystal." (12 2005).

2004

  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." (12 2004).
  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." in Conference on Photonic Crystal Materials and Nanostructures. (1 2004).
  • Harkins,P; McComb,D,W; MacKenzie,M; Craven,A,J "ELNES of titanate perovskites - a probe of structure and bonding." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." (11 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - A probe of structure and bonding." (10 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." (10 2004).
  • Johnson,N,P; Khokhar,A,Z; McLachlan,M,A; McComb,D,W; De La Rue,R,M "Application of pressure to shift the bandgap in polystyrene based photonic crystals." in Conference on Photonic Crystal Materials and Nanostructures. (1 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - a probe of structure and bonding." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." (10 2004).
  • MacKenzie,M; Craven,A,J; McComb,D,W; Hamilton,D,A; McFadzean,S "Spectrum imaging of high-k dielectric stacks." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Hamilton,D,A; Craven,A,J; MacKenzie,M; McComb,D,W "Understanding gate oxide materials: ELNES of Hf and Zr compounds." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." (1 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - a probe of structure and bonding." (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." (1 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." (1 2004).

2003

  • Paxton,A,T; Craven,A,J; Gregg,J,M; McComb,D,W "Bandstructure approach to near edge structure." in International Workshop on Strategies and Advances in Atomic-Level Spectroscopy and Analysis (SALSA). (4 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure." (4 2003).
  • Craven,A,J; MacKenzie,M; McComb,D,W; Hamilton,D,A "Application of spectrum imaging to the study of high-k dielectric stacks." in Conference on Microscopy of Semiconducting Materials. (1 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure." in International Workshop on Strategies and Advances in Atomic-Level Spectroscopy and Analysis (SALSA). (4 2003).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." in Conference on Microscopy of Semiconducting Materials. (1 2003).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." (1 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure.." (4 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure.." (4 2003).

2002

  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia.." in Electrically Based Microstructural Characterization III Symposium held at the 2001 MRS Fall Meeting. (1 2002).
  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia." (1 2002).
  • McComb, D.W. "Probing the electronic structure of transition metal oxides using electron energy-loss spectroscopy." (11 2002).
  • McComb,D,W; Ostanin,S; Vlachos,D; Craven,A,J; Finnis,M,W; Paxton,A,T; Alavi,A "The use of XANES and ELNES for the characterisation of stabilised zirconia.." in Electrically Based Microstructural Characterization III Symposium held at the 2001 MRS Fall Meeting. (1 2002).
  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia.." (1 2002).

2001

  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; McComb, D.W.; Scott, A.J. et al. "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • Ross, I.M.; Rainforth, W.M.; Scott, A.J.; Brown, A.P. et al. "Differentiation of zirconia polymorphs using EELS and ELNES." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • Maclean, E.D.W.; Craven, A.J.; McComb, D.W. "Valence losses at interfaces in aluminium alloys." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." in 4th International Topical Conference on Optical Probes on Pi-Conjugated Polymers and Photonic Crystals. (1 2001).
  • Maclean,E,DW; Craven,A,J; McComb,D,W "Valence losses at interfaces in aluminium alloys." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Ross,I,M; Rainforth,W,M; McComb,D,W; Scott,A,J; Brydson,R "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Ross,I,M; Rainforth,W,M; Scott,A,J; Brown,A,P; Brydson,R; McComb,D,W "Differentiation of zirconia polymorphs using EELS and ELNES." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Johnson,N,P; McComb,D,W; Richel,A; Treble,B,M; De La Rue,R,M "Synthesis and optical properties of opal and inverse opal photonic crystals." in 4th International Topical Conference on Optical Probes on Pi-Conjugated Polymers and Photonic Crystals. (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels.." (2 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." (2 2001).
  • MacKenzie,M; Weatherly,G,C; McComb,D,W; Perovic,A; Craven,A,J "Interfacial reaction products in Al-based metal-matrix composites." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." (1 2001).
  • Docherty,F,T; Craven,A,J; McComb,D,W; Skakle,J "ELNES investigations of the oxygen K-edge in spinels." in International Symposium on Spectroscopy of Materials. (2 2001).
  • McComb,D,W; Treble,B,M; Smith,C,J; De La Rue,R,M; Johnson,N,P "Synthesis and characterisation of photonic crystals." in 3rd Materials Discussion Meeting of the Royal-Society-of-Chemistry (MD3). (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; Scott, A.J.; Brown, A.P. et al. "Differentiation of zirconia polymorphs using EELS and ELNES." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; McComb, D.W.; Scott, A.J. et al. "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." (1 2001).
  • Maclean, E.D.W.; Craven, A.J.; McComb, D.W. "Valence losses at interfaces in aluminium alloys." (1 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." in 3rd Materials Discussion Meeting of the Royal-Society-of-Chemistry (MD3). (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." (2 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels.." (2 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." in International Sympopsium on Spectroscopy of Materials. (2 2001).

2000

  • McComb, D.W.; Ning, X.G.; Weatherly, G.C.; Pan, J. et al. "Interfacial reaction chemistry in Al-based metal-matrix composites." (11 2000).
  • McComb, D.W.; Ning, X.G.; Weatherly, G.C.; Pan, J. et al. "Interfacial reaction chemistry in Al-based metal-matrix composites." (11 2000).

1999

  • Docherty,F,T; Craven,A,J; McComb,D,W "ELNES investigations of the structure and electronic properties of chromium spinels." in Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 99). (1 1999).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W. "ELNES investigations of the structure and electronic properties of chromium spinels." in Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99). (1 1999).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W. "ELNES investigations of the structure and electronic properties of chromium spinels." (1 1999).

1997

  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." in Meeting of Microscopy of Composite Materials III. (2 1997).
  • Perović, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs. misfit dislocation formation in GexSi1-x/Si (100) heterostructures." (5 1997).
  • Yang,W; Weatherly,G,C; McComb,D,W; Lloyd,D,J "The structure of SiC-reinforced Mg casting alloys." in Meeting of Microscopy of Composite Materials III. (2 1997).
  • Perovic, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." (5 1997).
  • Perovic, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." in Proceedings of the International Conference on Pattern Formation in Fluids and Materials CPiP 96 (Collective Phenomena in Physics 96). (5 1997).
  • Perovic,D,D; Bahierathan,B; Lafontaine,H; HOUGHTON,D,C; McComb,D,W "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." in Proceedings of the International Conference on Pattern Formation in Fluids and Materials CPiP 96 (Collective Phenomena in Physics 96). (5 1997).
  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." (4 1997).
  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." (2 1997).

1995

  • McComb,D,W; Howie,A "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." in Symposium in Honor of R H Ritchie on His 70th Birthday - The Interaction of Swift Particles and Electromagnetic Fields with Matter. (5 1995).
  • McComb, D.W.; Howie, A. "Valence loss spectra from SiO2 polymorphs of different density." (5 1995).
  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." in Symposium in Honor of R H Ritchie on His 70th Birthday - The Interaction of Swift Particles and Electromagnetic Fields with Matter. (5 1995).
  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." (5 1995).

1991

  • Perovic,D,D; McComb,D,W; McGibbon,A,J; Brown,L,M "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MCCOMB, D.W.; PATERSON, J.H.; BUGLASS, J.G.; FRIEDMAN, S.L. "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MORE, A.P.; MCGIBBON, A.J.; MCCOMB, D.W. "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • PEROVIC, D.D.; MCCOMB, D.W.; MCGIBBON, A.J.; BROWN, L.M. "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • McComb,D,W; Paterson,J,H; Buglass,J,G; Friedman,S,L "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • PAYNE, R.S.; CRICK, R.A.; MCCOMB, D.W. "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MORE,A,P; McGibbon,A,J; McComb,D,W "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MCCOMB, D.W.; PATERSON, J.H.; BUGLASS, J.G.; FRIEDMAN, S.L. "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." (1 1991).
  • Payne,R,S; CRICK,R,A; McComb,D,W "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • McComb, D.W.; Paterson, J.H.; Buglass, J.G.; Friedman, S.L. "High-angle ADF imaging of the osmium carbonyl cluster [Os20(CO)40]2-." (12 1991).
  • Payne, R.S.; Crick, R.A.; McComb, D.W. "SI-K ELNES from various local atomic environments (LAE)." (12 1991).
  • PEROVIC, D.D.; MCCOMB, D.W.; MCGIBBON, A.J.; BROWN, L.M. "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." (1 1991).
  • MORE, A.P.; MCGIBBON, A.J.; MCCOMB, D.W. "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." (1 1991).
  • PAYNE, R.S.; CRICK, R.A.; MCCOMB, D.W. "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." (1 1991).
  • More, A.P.; McGibbon, A.J.; McComb, D.W. "Analysis of polymers in STEM using PEELS." (12 1991).
  • Perovic, D.D.; McComb, D.W.; McGibbon, A.J.; Brown, L.M. "STEM characterisation of impurity atom distributions across grain boundaries using PEELS and HAADF imaging." (12 1991).

1990

  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." (1 1990).
  • McComb, D.W.; Howie, A. "Characterisation of zeolite catalysts using electron energy loss spectroscopy." (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." in 1990 ANNUAL WORKSHOP ON THE CHARACTERIZATION OF CATALYSTS. (11 1990).
  • McComb,D,W; Howie,A "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." in CONF OF THE ROYAL MICROSCOPICAL SOC. (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." (11 1990).
  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." (1 1990).
  • McComb,D,W; Howie,A "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." in 1990 ANNUAL WORKSHOP ON THE CHARACTERIZATION OF CATALYSTS. (11 1990).
  • MCCOMB, D.W.; HOWIE, A. "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." in CONF OF THE ROYAL MICROSCOPICAL SOC. (1 1990).
  • McComb,D,W; Howie,A "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." in 1989 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INSTITUTE OF PHYSICS / ROYAL MICROSCOPICAL SOC ( EMAG-MICRO 89 ). (1 1990).

1989

  • MCCOMB, D.W.; HOWIE, A. "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." (1 1989).
  • McComb,D,W; Howie,A "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." in 1989 MEETING OF THE BRITISH ZEOLITE ASSOC : RECENT ADVANCES IN ZEOLITE SCIENCE. (1 1989).
  • McComb, D.W.; Howie, A. "Localized Electron Energy Loss Spectroscopy of Zeolite Catalysts in the Electron Microscope." (1 1989).
  • MCCOMB, D.W.; HOWIE, A. "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." in 1989 MEETING OF THE BRITISH ZEOLITE ASSOC : RECENT ADVANCES IN ZEOLITE SCIENCE. (1 1989).

1981

  • Fraser, H.L.; Hsieh, K.C.; Twigg, M.E. "ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY IN MINERALS PROCESSING.." (12 1981).

1980

  • FRASER, H.L. "ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MINERAL PROCESSING." (1 1980).
  • FRASER, H.L. "ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MINERAL PROCESSING." (1 1980).