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Scanning Electron Microscopy (SEM)


CEMAS has four scanning electron microscopes (SEM), providing many options for students, researchers, and industrial partners to analyze and investigate their materials-related issues.

Every SEM is outfitted with EDAX silicon-drift x-ray detectors, capable of very high-count rates for rapid compositional analysis of specimens, enabling elemental mapping of specimens in minutes, rather than hours.

CEMAS has two Apreo high resolution SEMs capable of imaging difficult samples at high resolution with low accelerating voltages. Each Apreo is equipped with an EDAX high-speed Hikari electron backscatter diffraction (EBSD) cameras that provide rapid crystallographic analysis of both bulk specimens and thin foils (Transmission Kikuchi Diffraction).

The newest SEM addition is the variable pressure Quattro ESEM equipped with multiple stages for in-situ experiments to study samples from -190 °C to 1100 °C and under load or wet conditions. Additionally, the Quattro has a full suite of analytical tools to analyze multiple aspects of each experiment.

Other capabilities available on the microscopes include large area mapping, cathodoluminescence imaging and spectroscopy, electrical feedthroughs for custom signal detection, and Scanning Transmission Electron Microscopy (STEM) imaging. Most importantly, the staff members at CEMAS have the expertise necessary to help users obtain best quality data possible, and the knowledge base to assist in its analysis.

Sn spheres on carbon, images of identical area with different detectors – T1, T2, and T3Sn spheres on carbon, images of identical area with different detectors – T1, T2, and T3. Image taken on Apreo SEM.