M&M 2020 Virtual: CEMAS Preview

Posted: 

The team at Ohio State’s Center for Electron Microscopy and Analysis (CEMAS) is gearing up for one of the largest annual gatherings dedicated to the science and application of microscopy and microanalysis, M&M 2020. This year, Microscopy & Microanalysis 2020 will transition to an entirely virtual format. Live and pre-recorded programming will be available for registrants August 3-7. 

CEMAS will be well represented at M&M 2020 with faculty, researchers, staff, students, and affiliates both in attendance and presenting material throughout the event. A selection of CEMAS representatives was also recently notified of award selections sponsored by the Microscopy Society of America (MSA) and Microanalysis Society (MAS). These awards will be presented at M&M 2020, which you can read more about here: https://go.osu.edu/cemas-mm2020.

To review the most recent schedule of sessions, exhibit times, posters, and other events, visit microscopy.org/MandM2020. A helpful list of FAQs about the virtual meeting platform is also available. Registration remains open; however, please note that separate registration is required for each individual. Click here to register.

Below represents CEMAS team members presenting at M&M 2020. If you’re a CEMAS collaborator and would like your name added to this list, let’s connect.

Session

Date

Session Start Time

Session End Time

Presentation Title

Presenter

A02.3

8/5/2020

10:00 AM 

11:15 AM

284 - Connecting Structural Heterogeneity to Properties of Disordered Materials

Jinwoo Hwang

P01.3 

8/5/2020

10:00 AM

11:15 AM

327 - Point Defects and Complexes in Gallium Oxide Materials and Devices

Jinwoo Hwang

A08.3 

8/5/2020

11:30 AM

12:45 PM

390 - X-ray MicroCT Imaging of Dentin Tubules in a Human Tooth

Carley Goodwin

A05.4

8/5/2020

11:30 AM

12:45 PM

382 - Investigation of Antiphase Domain Boundaries in Cobalt Ferrite Thin Films via High Resolution Scanning Transmission Electron Microscopy 

Amanda Trout

P08.5

8/5/2020

2:00 PM

3:15 PM

662 - Imaging of Magnetic Textures in Polycrystalline FeGe Thin Films via in-situ Lorentz Transmission Electron Microscopy

Nuria Bagues Salguero

A07.5 

8/5/2020

2:00 PM

3:15 PM 

605 - Quantitative SEM-EDS Analysis of Semi-transparent Samples

Stephen Boona

A02.6 

8/6/2020

10:00 AM 

11:15 AM

677 - 4D-STEM Quantification of Nanoscale Ordered Domains in Organic Semiconducting Polymers

Gabriel Calderon Ortiz

P12.1 

8/6/2020

10:00 AM 

11:15 AM

811 - Exploration of Novel Ordering Mechanism in Titanium Alloys Using Atom Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy

Yufeng Zheng

P06.4 

8/6/2020

10:00 AM

11:15 AM

793 - Investigation of Solid-state Transformations Under Extreme Thermal Transients Using in-situ TEM Heating Experiments 

Sriram Vijayan

A04.1

8/6/2020

10:00 AM

11:15 AM

378 - Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry

Menglin Zhu

A04.2 

8/6/2020

11:30 AM

12:45 PM 

1208 - Electron Energy Loss Spectroscopy of Vanadium Tetracyanoethylene

Amanda Trout

A02.7 

8/6/2020

11:30 AM 

12:45 PM

745 - Spatial Frequency Selection in Lorentz 4D-Scanning Transmission Electron Microscopy Reconstruction

Binbin Wang

P11.3

8/7/2020

10:00 AM 

11:15 AM

1196 - Revealing the Atomic Structure of Rh/y-Al203 Catalysts Using Low Dose Rate Electron Microscopy

Cheng-Han Li

P03.6

8/7/2020

11:30 AM 

12:45 PM

1226 - Characterization of Nano-Scale Defects in Pulsed Laser Deposited (PLD) Thin Films of Li3xNd(2/3-x)(1/3-2x)TiO3 (NLTO) by Aberration Corrected HR-STEM Imaging and Dual-EELS

Robert Williams

A09.P2

8/7/2020

2:00

PM

3:30

PM

SEM & STEM Multi-scale Characterization of Fatigue Damage in CrCoNi Medium-entropy Alloy with Fully Recrystallized Microstructure

Milan Heczko