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FEI Quanta 200 SEM

 


Back Scatter Electron image of Au nano-islands on carbonBack Scatter Electron image of Au nano-islands on carbonThe Quanta 200 Scanning Electron Microscope (SEM) is a flexible, general purpose, simple-to-use instrument that can be operated in either regular high-vacuum or low-vacuum modes, enabling users to image a wide variety of samples. This ease of use allows users to start collecting data quickly after their initial training, along with making the instrument an excellent hands-on teaching platform for various Materials Science courses.

The electron beam in this instrument isgenerated by a conventional tungsten filament electron source, which, under optimal conditions, is capable of resolving features as small as 3 nm. The Quanta is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, in addition to an Energy Low magnification secondary electron image of sugar crystals on carbonLow magnification secondary electron image of sugar crystals on carbonDispersive X-ray Analysis (EDS) detector and an internal TV camera. 

 

Features of the Quanta200 include:

  • SE, BSE, and EDS Detectors
  • Accelerating voltage between 200 V and 30 kV
  • 3.0 nm resolution at 30 kV
  • 10 nm resolution at 3 kV
  • EDAX 102 mm Octane Prime EDS detector