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FEI Quanta 200 SEM
The Quanta 200 Scanning Electron Microscope (SEM) is a flexible, general purpose, simple-to-use instrument that can be operated in either regular high-vacuum or low-vacuum modes, enabling users to image a wide variety of samples. This ease of use allows users to start collecting data quickly after their initial training, along with making the instrument an excellent hands-on teaching platform for various Materials Science courses.
The electron beam in this instrument is generated by a conventional tungsten filament electron source, which, under optimal conditions, is capable of resolving features as small as 3 nm. The Quanta is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, in addition to an EnergyDispersive X-ray Analysis (EDS) detector and an internal TV camera.
Features of the Quanta200 include:
- SE, BSE, and EDS Detectors
- Accelerating voltage between 200 V and 30 kV
- 3.0 nm resolution at 30 kV
- 10 nm resolution at 3 kV
- EDAX 102 mm Octane Prime EDS detector