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Remote Microscopy Program
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Beyond the Scope: CEMAS Discussion Series
On The Scope – A Masterclass in Practical Scanning Electron Microscopy
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Tour Request Form
CAPABILITIES
SCANNING ELECTRON MICROSCOPY (SEM)
Thermo Scientific Apreo SEMs
Thermo Scientific Quattro ESEM
FOCUSED ION BEAM (FIB) MICROSCOPY
Helios NanoLab 600 DualBeam, formerly produced by FEI
Nova NanoLab 600 DualBeam, formerly produced by FEI
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Thermo Scientific Themis Z S/TEM
Titan 60-300 TEM, formerly produced by FEI
Tecnai F20 TEM, formerly produced by FEI
Tecnai G2-30 TEM, formerly produced by FEI
CRYO-ELECTRON MICROSCOPY (CRYO-EM)
Thermo Scientific Glacios Cryo-TEM
Thermo Scientific Krios G3i Cryo-TEM
X-RAY DIFFRACTION (XRD)
Rigaku SmartLab XRD
Rigaku MiniFlex XRD
MICRO COMPUTED-TOMOGRAPHY (MICROCT)
SAMPLE PREPARATION
ACADEMIA
Teaching
Training
On The Scope – A Masterclass in Practical Scanning Electron Microscopy
INDUSTRY
Working with CEMAS
Aerospace
Automotive
Consumer Products
Cybersecurity
Manufacturing
Materials
Training
On the Scope – A Masterclass in Practical Scanning Electron Microscopy
RESEARCH
Image Submission
Publications
Awards
OUTREACH
Outreach
Alumni
Community Outreach
Global Presence
STEM K-12
CEMAS-Metro Science Enrichment
Microscopy Education Modules
Main navigation
ABOUT
About Us
About Us
Vision & Mission
Directory
News
Location & Contact
Location & Contact
Transportation
Travel & Lodging
Using CEMAS
Using CEMAS
Become a CEMAS User
Policies & Procedures
Environmental Health & Safety
Rates
Find Funding
Frequently Asked Questions
Collaboration Spaces
Provide Feedback
Services
Services
Remote Microscopy Program
Virtual Learning Digital Theater
Image-Processing
CEMAS Graduate Wellness Committee
CEMAS Wellness Room
Events
Events
Beyond the Scope: CEMAS Discussion Series
On The Scope – A Masterclass in Practical Scanning Electron Microscopy
Facility Tours
Facility Tours
Take A Virtual Tour
Tour Request Form
CAPABILITIES
SCANNING ELECTRON MICROSCOPY (SEM)
SCANNING ELECTRON MICROSCOPY (SEM)
Thermo Scientific Apreo SEMs
Thermo Scientific Quattro ESEM
FOCUSED ION BEAM (FIB) MICROSCOPY
FOCUSED ION BEAM (FIB) MICROSCOPY
Helios NanoLab 600 DualBeam, formerly produced by FEI
Nova NanoLab 600 DualBeam, formerly produced by FEI
TRANSMISSION ELECTRON MICROSCOPY (TEM)
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Thermo Scientific Themis Z S/TEM
Titan 60-300 TEM, formerly produced by FEI
Tecnai F20 TEM, formerly produced by FEI
Tecnai G2-30 TEM, formerly produced by FEI
CRYO-ELECTRON MICROSCOPY (CRYO-EM)
CRYO-ELECTRON MICROSCOPY (CRYO-EM)
Thermo Scientific Glacios Cryo-TEM
Thermo Scientific Krios G3i Cryo-TEM
X-RAY DIFFRACTION (XRD)
X-RAY DIFFRACTION (XRD)
Rigaku SmartLab XRD
Rigaku MiniFlex XRD
MICRO COMPUTED-TOMOGRAPHY (MICROCT)
SAMPLE PREPARATION
ACADEMIA
Teaching
Training
Training
On The Scope – A Masterclass in Practical Scanning Electron Microscopy
INDUSTRY
Working with CEMAS
Working with CEMAS
Aerospace
Automotive
Consumer Products
Cybersecurity
Manufacturing
Materials
Training
Training
On the Scope – A Masterclass in Practical Scanning Electron Microscopy
RESEARCH
Image Submission
Publications
Awards
OUTREACH
Outreach
Alumni
Community Outreach
Global Presence
STEM K-12
STEM K-12
CEMAS-Metro Science Enrichment
Microscopy Education Modules
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