Quanta 200 SEM, formerly produced by FEI

 


 

quanta copy.jpg

 

The Quanta 200 Scanning Electron Microscope (SEM) is a flexible, general purpose, simple-to-use instrument that can be operated in either regular high-vacuum or low-vacuum modes, enabling users to image a wide variety of samples. This ease of use allows users to start collecting data quickly after their initial training, along with making the instrument an excellent hands-on teaching platform for various Materials Science courses.

The electron beam in this instrument is generated by a conventional tungsten filament electron source, which, under optimal conditions, is capable of resolving features as small as 3 nm. The Quanta is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, in addition to an Energy 

Dispersive X-ray Analysis (EDS) detector and an internal TV camera. 

 

Features of the Quanta200 include:

Back Scatter Electron image of Au nano-islands on carbon
Back Scatter Electron image of Au nano-islands on carbon
Low magnification secondary electron image of sugar crystals on carbon
Low magnification secondary electron image of sugar crystals on carbon
  • SE, BSE, and EDS Detectors
  • Accelerating voltage between 200 V and 30 kV
  • 3.0 nm resolution at 30 kV
  • 10 nm resolution at 3 kV
  • EDAX 60 mm2 Octane Super EDS detector

 

Category: SEM

Subscribe

Want to keep up with the latest insights from CEMAS? Click here to sign up

Get Started Today

Interested in the Quanta?

New users: Click here to become a new user.

Current users: Cick here to schedule time.

Questions? Contact us at cemas@osu.edu.