The CEMAS SmartLab XRD is our most flexible diffractometer. It has the ability to run in many different modes with the system providing guidance for the user in preparing data acquisition. The Guidance™ software leads the user step-by-step through acquisition setup and provides for automated alignments before data collection.
The Cross-Beam Optics™ (CBO) allows rapid switching between diverging (Bragg-Brentano) and parallel beam modes. For ultra-high resolution work, the system includes a 4-bounce Ge (220) monochromator (source) and a 2-bounce Ge analyzer (detector). To minimize fluorescence issues, a Diffracted Beam Monochromator (DBM) can be inserted. This is especially useful in reducing background when analyzing Co, Fe, and Mn containing samples.
The “in-plane” arm provides the ability to do in-plane grazing incidence scans. It also gives the ability to do pole-figure measurements.
· Parafocusing Bragg-Brentano XRD for powder and polycrystalline film samples. Texture and orientation analysis. With or without DBM
· Parallel beam: Grazing incidence XRD for thin film polycrystalline thin films samples, medium resolution x-ray reflectivity (XRR).
· Parallel beam multilayer mirror + Ge (220) 4-bounce monochromator: High resolution rocking curve measurement on semiconductor epi-layers and heterostructures. High resolution x-ray reflectivity on thin film and multilayer structures.
· Parallel beam mirror+ Ge (220) 4-bounce monochromator +Ge (220) 2-bounce analyzer: High resolution reciprocal space maps (RSM).
· RX-RY Stage: For surface normal alignment (mis-cut correction).