Quanta 200 SEM, formerly produced by FEI

 


 

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Back Scatter Electron image of Au nano-islands on carbon
Back Scatter Electron image of Au nano-islands on carbon

The Quanta 200 Scanning Electron Microscope (SEM) is a flexible, general purpose, simple-to-use instrument that can be operated in either regular high-vacuum or low-vacuum modes, enabling users to image a wide variety of samples. This ease of use allows users to start collecting data quickly after their initial training, along with making the instrument an excellent hands-on teaching platform for various Materials Science courses.

The electron beam in this instrument is generated by a conventional tungsten filament electron source, which, under optimal conditions, is capable of resolving features as small as 3 nm. The Quanta is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, in addition to an Energy 

Low magnification secondary electron image of sugar crystals on carbon
Low magnification secondary electron image of sugar crystals on carbon

Dispersive X-ray Analysis (EDS) detector and an internal TV camera. 

 

Features of the Quanta200 include:

  • SE, BSE, and EDS Detectors
  • Accelerating voltage between 200 V and 30 kV
  • 3.0 nm resolution at 30 kV
  • 10 nm resolution at 3 kV
  • EDAX 60 mm2 Octane Super EDS detector

 

Category: SEM

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